專題文章 : 2022年4月份Mini-Circuits新產品發佈-Amplifiers & Filters & Test Solutions



ZHL2G02G4125+

High Power Amplifier

50Ω 2000 to 2400 MHz

• Saturated power, 125W typ.

• Wide bandwidth, 2000 to 2400 MHz

• High gain, 51 dB typ.

• Self-protected from overheating and reverse polarity

• Self-protected against too much reflected power

• Self-protected against too much forward power

 

APPLICATIONS

• High power test sets

• Burn-in set-ups

• Communications

• Satcom

ZVA-35703+

High-Frequency Amplifier

50Ω 35 to 71 GHz

• High gain 17.5 dB typ. over the entire operating band

• Excellent gain flatness, ±1.5 dB typ.

• High Psat = 21 dBm typ.

• Adjustable DC voltage, +10 to +15 V

 

APPLICATIONS

• Automotive tests

• Radar/Sensing

• 5G FR2+ bands (Ka-band, Q-band, V-band, E-band)

• SATCOM

• Wireless Infrastructure

• IEEE 802.11.ad WiGig

ZVA-71863LNX+

High-Frequency Amplifier

50Ω 71 to 86 GHz

• High gain, 37 dB typ.

• Excellent gain flatness, ±1.75 dB typ.

• Low noise figure = 4.5 dB typ. from 71 to 81 GHz

• Adjustable single supply voltage, +10 to +15V

 

APPLICATIONS

• Automotive test

• Radar/Sensing

• 5G FR2+ bands (E-band)

• SATCOM E-band

• Wireless infrastructure

BBFCG2-372+

Bandpass Filter & Balun

50Ω 3300 to 4000 MHz

• Tiny size, (0805)

• Compact design includes Balun & Filter in one package

• Low cost

• Temperature stable

• Hermetically sealed

 

APPLICATIONS

• Telecommunications

• 5G sub 6GHz

BBFCG2-3650+

Bandpass Filter & Balun

50Ω 3150 to 4150 MHz

• Tiny size, (0805)

• Compact design includes Balun & Filter in one package

• Low cost

• Temperature stable

• Hermetically sealed

 

APPLICATIONS

• Telecommunications

• 5G sub 6GHz

SSG-30G-RC

Wideband Signal Generator

50Ω -47 dBm to +23 dBm, 10 MHz to 30 GHz

• Millimeter wave signal source

• High output power @ 30 GHz

• Pulse modulation with 0.5 µs pulse width

• USB and Ethernet control

 

APPLICATIONS

• 5G FR2 bands n257, n258 & n261

• K & Ku band radar

• Wideband LO source

• Microwave & millimeter wave radio testing


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